Ready To Ship Jeol Bp101734-02 Swp Gen Pb(1) Pcb Card Jws-2000 Wafer Review Sem Working Holiday Edition [aWQplvhn]

JEOL BP101734-02 PCB Card: High-Quality Semiconductor Component

The JEOL BP101734-02 SWP GEN PB(1) PCB Card is a premium semiconductor component designed for advanced wafer inspection systems. This card is part of the JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System, renowned for its precision and efficiency. With its U18 feature, the card ensures optimal performance and reliability in semiconductor manufacturing processes.

Key Features and Specifications

This JEOL BP101734-02 PCB Card boasts several key features that make it a valuable addition to your semiconductor equipment. The card is designed for use in the JWS-2000 SEM system, ensuring seamless integration and compatibility. Here are some of its key specifications:

• Part Number: BP101734-02
• Model Number: SWP GEN PB(1)
• Physical Condition: Good, with signs of previous use and handling

This card is a working surplus, offering a cost-effective solution for your semiconductor needs without compromising on quality.

Practical Uses and Benefits

The JEOL BP101734-02 PCB Card is an essential component for wafer inspection systems in the semiconductor industry. Its practical uses include:

• Wafer Defect Review: The card's U18 feature ensures accurate defect analysis and identification, enabling manufacturers to produce high-quality semiconductor products.
• Scanning Electron Microscopy (SEM): The card is compatible with SEM systems, allowing for detailed imaging and analysis of wafer surfaces.

This card also comes with a 90-day satisfaction guarantee, providing peace of mind for your investment.