The Perfect Xilinx Field Programmable Gate Array, Part #: Xa7s50-1fgga484i | Fpga | Dex Best Choice [Zws0qFTQ]

Xilinx FPGA XA7S50-1FGGA484I

The Xilinx FPGA XA7S50-1FGGA484I is a cutting-edge device designed for high-performance and low-power applications. This FPGA is optimized for 1.8V systems, making it an ideal choice for energy-efficient designs. With densities ranging from 32 to 512 macrocells, it offers a versatile solution for various logic synthesis needs. The XA7S50-1FGGA484I stands out in the industry with its 0.18 micron CMOS technology, providing exceptional performance and reliability.

Key Features and Specifications

The XA7S50-1FGGA484I is equipped with a range of advanced features that enhance its performance and usability. Its multi-voltage I/O operation supports voltages from 1.5V to 3.3V, allowing seamless integration into diverse systems. The FPGA boasts fast system programming capabilities, including 1.8V ISP using the IEEE 1532 (JTAG) interface. Other notable features include On-The-Fly Reconfiguration (OTF), IEEE1149.1 JTAG Boundary Scan Test, and optional Schmitt trigger input for enhanced signal integrity. The XA7S50-1FGGA484I also features multiple I/O banks and unparalleled low power management, ensuring efficient operation and extended battery life.

Practical Applications and Benefits

The Xilinx FPGA XA7S50-1FGGA484I is a versatile solution for a wide range of applications. Its high-speed and low-power characteristics make it ideal for high-speed data communications and computing systems, as well as leading-edge portable products. The FPGA's In System Programming (ISP) capability allows for easy updates and modifications, ensuring flexibility and adaptability in design. With its advanced clocking modes, optional DualEDGE triggered registers, and efficient control term clocks, the XA7S50-1FGGA484I offers unparalleled performance and efficiency. Additionally, its advanced design security features and open-drain output option for Wired-OR and LED drive further enhance its practicality and reliability.