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Teseq NSG 3060 CDN 3061 Transient Test System

The Teseq NSG 3060 CDN 3061 is a cutting-edge transient test system designed to elevate the testing experience. This innovative system, built on the successful Modula series design, offers a versatile and modular architecture that caters to both basic testing needs and the demands of sophisticated test laboratories. With its user-friendly interface and extensive expansion capabilities, the NSG 3060 CDN 3061 is the ideal choice for professionals seeking a reliable and efficient solution for their transient testing requirements.

Advanced Features and Specifications

The NSG 3060 CDN 3061 is designed to meet the stringent requirements of CE mark and ANSI C62.41 testing. It performs a comprehensive range of tests, including Combination wave surge, Ring wave, and Electrical Fast Transient (EFT) pulses, as well as Power Quality Testing (PQT). The system's modular design allows for the easy addition of new pulse generator modules, thanks to the unique "Master-Slave" concept. This technology ensures individual pulse modules can be calibrated separately, eliminating the need for recalibration of the entire system. The NSG 3060 CDN 3061 exceeds existing standards with its state-of-the-art components, providing precise switching and phase accuracy.

Practical Applications and Benefits

The Teseq NSG 3060 CDN 3061 is an invaluable tool for a wide range of industries, including electronics, automotive, and telecommunications. Its user-friendly graphic display and touch panel interface make test setup quick and efficient, with all parameters highly visible and easily selectable. The system's Expert Mode allows for manual parameter changes during testing, enabling users to identify critical threshold values effectively. The Test Assistance (TA) function streamlines standardized testing, ensuring quick and reliable results. With its easily accessible SD memory card, firmware downloads and test data storage are seamless, making the NSG 3060 CDN 3061 a practical and efficient solution for any testing environment.